The constrained blister test for the specific energy of interfacial adhesion
Title: The constrained blister test for the specific energy of interfacial adhesion
Author(s): M. J. Napolitano, A. Chudnovsky, A. Moet, M; Evans
Paper category : conference
Book title: International RILEM Symposium on Building Joint Sealants
Editor(s): A.T. Wolf
Publisher: RILEM Publications SARL
Publication year: 1998
Pages: 115 - 129
Total Pages: 15
Nb references: 23
Abstract: Although the peel test is simple to perform, analysis of the peel force is complex. It is almost impossible to separate energy of adhesion from energy to produce rupture of the adhesive itself. Substitution of a constrained blister test makes it possible to calculate two parameters, y, the specific energy of interfacial adhesion and B, the dissipative behaviour of the adhesive interphase for a specific adhesive/adherent system.
The paper will not present the derivation of the equation, but will describe the equipment itself and show some data which where obtained with it. The blister is produced by nitrogen pressure applied through a small hole drilled in a copper base.
The adhesive (in this case a pressure-sensitive adhesive tape) is applied to the base and subjected to pressure. When the blister that is formed rises to a certain (known) height, it reaches a constraining glass plate. After this the area subsumed by the bubble increases as a function of time. From the rate of growth, it is possible to calculate y and B.
Constrained blister test (CBT) was designed to measure the specific energy (y) of polymeric films and coatings.
The validity of the derived theoretical model was tested using a rubber-based pressure sensitive adhesive (PSA) tape. The PSA tape was investigated as a function of applied pressure and spacer height. A value of 44 J/m 2 was determined for the specific energy of interfacial adhesion. The dissipate coefficient, B, was found to vary with the applied pressure and the spacer height.
Online publication: 2003-05-25
Publication type : full_text
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