Sign up for our Newsletter



Quantification of mineral admixtures content on cement by rietveld method

Title: Quantification of mineral admixtures content on cement by rietveld method
Author(s): L.A. Gobbo, L.M. Sant’Agostino and J.L. Antoniassi
Paper category : conference
Book title: 2nd International RILEM Conference on Progress of Recycling in the Built Environment
Editor(s): V.M. John, E. Vazquez, S.C. Angulo, C. Ulsen
e-ISBN: 978-2-35158-122-3
Publisher: RILEM Publications SARL
Publication year: 2011
Pages: 441 - 448
Total Pages: 8
Nb references: 13
Language: English

Abstract: This study was focused on the application of X-ray diffraction and Rietveld method (XRDRietveld) on the characterization and quantification of Portland cement. The Rietveld method was introduced by Hugo Rietveld in 1969 and is based on the simulation of the whole diffraction spectrum from the components structural data, allowing for refining instrumental and crystallographic parameters.

X-ray fluorescence (XRF) and loss on ignition (LOI) were used as support tecnhiques to evaluate XRD-Rietveld.

XRD-Rietveld presented as a high reproducibility technique with technical and logistics advantages. The technique was considered adequate to be applied on the quantification of Portland cement components such as limestone, pozzolanic materials and blast-furnace slags.
With XRD-Rietveld, was possible to evaluate the clinker phases, limestone and gypsum, and using an internal standard, the technique leads to the quantification of compounds with amorphous phases. Results of limestone proportions in the quantification of cements presents a high correlation with the proportions added in the cement composition (R2=0.99), what was also observed in the case of gypsum added (R2=0.99). Good correlations were also obtained between the fly ash and slags proportions in the samples and XRD-Rietveld obtained values (R2=0.99 to fly ash; R2=0.98 to slag).

Online publication: 2012-02-08
Publication type : full_text
Public price (Euros): 0.00

>> You must be connected to view the paper. You can register for free if you are not a member