Atomic force microscopy for cementitious materials

Title: Atomic force microscopy for cementitious materials
Author(s): Paramita Mondal, Surendra Shah, Laurence Marks
Paper category : conference
Book title: NICOM 2: 2nd International Symposium on Nanotechnology in Construction
Editor(s): Y. de Miguel, A. Porro and P.J.M. Bartos
Print-ISBN: 2-912143-87-X
e-ISBN: 2912143888
Publisher: RILEM Publications SARL
Publication year: 2006
Pages: 179 - 185
Total Pages: 7
Nb references: 8
Language: English

Abstract: Atomic force microscopy (AFM) is a technique that is capable of both imaging surface structure and recording local mechanical properties of the sample. AFM was used to image nano- and microstructure of cement paste after a few hours of hydration and after it is completely hardened. A Hysitron TriboIndenter has been used to determine mechanical properties while also providing in-situ SPM images. This technique can be used to investigate the effects of different additives and how properties change at the nanoscalel. Mechanical properties adjacent to fibers and aggregates are also of interest where both AFM and the TriboIndenter can be useful. This introduces new possibilities for characterizing the properties of the interfacial transition zone that has a considerable effect on the overall performance of cement-based materials.

Online publication: 2005-11-17
Publication type : full_text
Public price (Euros): 0.00